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Projections for Resolving Delaunay Encroachment

Eastlick, Mark, Carlos Bedregal

Research Notes, 26th International Meshing Roundtable, Sandia National Laboratories, September 18-21 2017

INTERNATIONAL
MESHING
ROUNTABLE

26th International Meshing Roundtable
Barcelona, Spain
September 18-21, 2017

Mark Eastlick, Silvaco Europe Ltd., GB, mark.eastlick@silvaco.com
Carlos Bedregal, Silvaco, Inc., US, carlos.bedregal@silvaco.com

Research Note Abstract
An efficient method for sampling the features of piecewise smooth domains in the context of restricted Delaunay triangulation is presented. This scheme is based on off-center refinement and is designed to minimize the number of samples needed to correctly resolve the topology of the input. Nearest-point projection is used in regions away from features intersecting at acute angles and circular projection avoids the explicit protection machinery used by other methods where such sharp features occur. A comparison with two standard approaches is provided which demonstrates the significant reduction of vertices on termination of the processes.

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